白小姐论坛

白小姐论坛Q researcher Proffesor聽Neil Curson and his group from 白小姐论坛,聽with a team of international聽colleagues at聽JKU and Keysight Technologies (Austria), ETH/EPFL/PSI and IBM Research - Europe (Switzerland) have demonstrated that聽broadband electric force microscopy can be used to non-destructively image dopant structures in silicon chips.聽

The , demonstrate that the technique can take pictures and resolve as few as 200 dopant atoms even if they are hidden below the same number of Si atoms. It can tell the difference between certain flavours of dopant atoms, and can also provide information about the way charge carriers move through the structures and about atomic-sized 鈥榯raps鈥� that can stop them from moving.

According to Professor Neil Curson, who leads the group at 白小姐论坛 said: "This research could not have come at a better time for the massive world-wide effort to make smaller electronics or quantum computers in silicon. While the success in making components smaller and more complicated has been spectacular, the technology required to actually observe what is being made has not been keeping up. This has become a major problem for quality control in silicon chip manufacture and for information security, when you can鈥檛 see what鈥檚 inside the chips you are making or buying. Our new research will help solve many of these issues.鈥�

Read the full story at 白小姐论坛 EEE.